Tomas Pecenka, Lukás Sekanina, Zdenek Kotásek. Evolution of synthetic RTL benchmark circuits with predefined testability. ACM Trans. Design Autom. Electr. Syst., 13(3), 2008. [doi]
@article{PecenkaSK08,
title = {Evolution of synthetic RTL benchmark circuits with predefined testability},
author = {Tomas Pecenka and Lukás Sekanina and Zdenek Kotásek},
year = {2008},
doi = {10.1145/1367045.1367063},
url = {http://doi.acm.org/10.1145/1367045.1367063},
tags = {testing},
researchr = {https://researchr.org/publication/PecenkaSK08},
cites = {0},
citedby = {0},
journal = {ACM Trans. Design Autom. Electr. Syst.},
volume = {13},
number = {3},
}