The IEEE standards on reliability program and reliability prediction methods for electronic equipment

Michael G. Pecht, Diganta Das, Arun Ramakrishnan. The IEEE standards on reliability program and reliability prediction methods for electronic equipment. Microelectronics Reliability, 42(9-11):1259-1266, 2002. [doi]

Authors

Michael G. Pecht

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Diganta Das

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Arun Ramakrishnan

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