Michael G. Pecht, Diganta Das, Arun Ramakrishnan. The IEEE standards on reliability program and reliability prediction methods for electronic equipment. Microelectronics Reliability, 42(9-11):1259-1266, 2002. [doi]
@article{PechtDR02,
title = {The IEEE standards on reliability program and reliability prediction methods for electronic equipment},
author = {Michael G. Pecht and Diganta Das and Arun Ramakrishnan},
year = {2002},
doi = {10.1016/S0026-2714(02)00132-4},
url = {http://dx.doi.org/10.1016/S0026-2714(02)00132-4},
tags = {reliability},
researchr = {https://researchr.org/publication/PechtDR02},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {42},
number = {9-11},
pages = {1259-1266},
}