A fusion prognostics-based qualification test methodology for microelectronic products

Michael Pecht, Tadahiro Shibutani, Myeongsu Kang, Melinda Hodkiewicz, Edward Cripps. A fusion prognostics-based qualification test methodology for microelectronic products. Microelectronics Reliability, 63:320-324, 2016. [doi]

Authors

Michael Pecht

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Tadahiro Shibutani

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Myeongsu Kang

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Melinda Hodkiewicz

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Edward Cripps

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