Michael Pecht, Tadahiro Shibutani, Myeongsu Kang, Melinda Hodkiewicz, Edward Cripps. A fusion prognostics-based qualification test methodology for microelectronic products. Microelectronics Reliability, 63:320-324, 2016. [doi]
@article{PechtSKHC16,
title = {A fusion prognostics-based qualification test methodology for microelectronic products},
author = {Michael Pecht and Tadahiro Shibutani and Myeongsu Kang and Melinda Hodkiewicz and Edward Cripps},
year = {2016},
doi = {10.1016/j.microrel.2016.04.002},
url = {http://dx.doi.org/10.1016/j.microrel.2016.04.002},
researchr = {https://researchr.org/publication/PechtSKHC16},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {63},
pages = {320-324},
}