G. Pedreira, Javier Martín-Martínez, Javier Diaz-Fortuny, P. Saraza-Canflanca, Rosana Rodríguez, R. Castro-López, Elisenda Roca, Francisco V. Fernández, Montserrat Nafría. A New Time Efficient Methodology for the Massive Characterization of RTN in CMOS Devices. In IEEE International Reliability Physics Symposium, IRPS 2019, Monterey, CA, USA, March 31 - April 4, 2019. pages 1-5, IEEE, 2019. [doi]
Abstract is missing.