Olalla Varela Pedreira, Houman Zahedmanesh, Youqi Ding, Ivan Ciofi, Kristof Croes. Challenges for Interconnect Reliability: From Element to System Level. In David G. Chinnery, Iris Hui-Ru Jiang, editors, Proceedings of the 2023 International Symposium on Physical Design, ISPD 2023, Virtual Event, USA, March 26-29, 2023. pages 106, ACM, 2023. [doi]
Abstract is missing.