Wei Pei, Wen-Ben Jone, Yiming Hu. Fault Modeling and Detection for Drowsy SRAM Caches. In Scott Davidson, Anne Gattiker, editors, 2006 IEEE International Test Conference, ITC 2006, Santa Clara, CA, USA, October 22-27, 2006. pages 1-10, IEEE, 2006. [doi]
Abstract is missing.