Songwei Pei, Huawei Li, Xiaowei Li. An on-chip clock generation scheme for faster-than-at-speed delay testing. In Design, Automation and Test in Europe, DATE 2010, Dresden, Germany, March 8-12, 2010. pages 1353-1356, IEEE, 2010. [doi]
@inproceedings{PeiLL10,
title = {An on-chip clock generation scheme for faster-than-at-speed delay testing},
author = {Songwei Pei and Huawei Li and Xiaowei Li},
year = {2010},
url = {http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5457020},
tags = {testing},
researchr = {https://researchr.org/publication/PeiLL10},
cites = {0},
citedby = {0},
pages = {1353-1356},
booktitle = {Design, Automation and Test in Europe, DATE 2010, Dresden, Germany, March 8-12, 2010},
publisher = {IEEE},
}