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Songwei Pei, Huawei Li, Xiaowei Li. An on-chip clock generation scheme for faster-than-at-speed delay testing. In Design, Automation and Test in Europe, DATE 2010, Dresden, Germany, March 8-12, 2010. pages 1353-1356, IEEE, 2010. [doi]
Possibly Related PublicationsThe following publications are possibly variants of this publication: Enhanced LCCG: A novel test clock generation scheme for faster-than-at-speed delay testingSongwei Pei, Ye Geng, Huawei Li, Jun Liu, Song Jin. aspdac 2015: 514-519 [doi] Functional Built-In Delay Binning and Calibration Mechanism for On-Chip at-Speed Self TestChen-I Chung, Jyun-Sian Jhou, Ching-Hwa Cheng, Sih-Yan Li. ats 2009: 163-168 [doi]
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