IC HTOL Test Stress Condition Optimization - researchr publication authors

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Brian Peng, Ing-Yi Chen, Sy-Yen Kuo, Colin Bolger. IC HTOL Test Stress Condition Optimization. In 19th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2004), 10-13 October 2004, Cannes, France, Proceedings. pages 272-279, IEEE Computer Society, 2004. [doi]

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