Brian Peng, Ing-Yi Chen, Sy-Yen Kuo, Colin Bolger. IC HTOL Test Stress Condition Optimization. In 19th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2004), 10-13 October 2004, Cannes, France, Proceedings. pages 272-279, IEEE Computer Society, 2004. [doi]
@inproceedings{PengCKB04,
title = {IC HTOL Test Stress Condition Optimization},
author = {Brian Peng and Ing-Yi Chen and Sy-Yen Kuo and Colin Bolger},
year = {2004},
url = {http://csdl.computer.org/comp/proceedings/dft/2004/2241/00/22410272abs.htm},
tags = {optimization, testing},
researchr = {https://researchr.org/publication/PengCKB04},
cites = {0},
citedby = {0},
pages = {272-279},
booktitle = {19th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2004), 10-13 October 2004, Cannes, France, Proceedings},
publisher = {IEEE Computer Society},
isbn = {0-7695-2241-6},
}