Ke Peng, Mahmut Yilmaz, Krishnendu Chakrabarty, Mohammad Tehranipoor. Crosstalk- and Process Variations-Aware High-Quality Tests for Small-Delay Defects. IEEE Trans. VLSI Syst., 21(6):1129-1142, 2013. [doi]
@article{PengYCT13,
title = {Crosstalk- and Process Variations-Aware High-Quality Tests for Small-Delay Defects},
author = {Ke Peng and Mahmut Yilmaz and Krishnendu Chakrabarty and Mohammad Tehranipoor},
year = {2013},
doi = {10.1109/TVLSI.2012.2205026},
url = {http://dx.doi.org/10.1109/TVLSI.2012.2205026},
researchr = {https://researchr.org/publication/PengYCT13},
cites = {0},
citedby = {0},
journal = {IEEE Trans. VLSI Syst.},
volume = {21},
number = {6},
pages = {1129-1142},
}