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Crosstalk- and Process Variations-Aware High-Quality Tests for Small-Delay Defects

Ke Peng, Mahmut Yilmaz, Krishnendu Chakrabarty, Mohammad Tehranipoor. Crosstalk- and Process Variations-Aware High-Quality Tests for Small-Delay Defects. IEEE Trans. VLSI Syst., 21(6):1129-1142, 2013. [doi]

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