Circuit Path Grading Considering Layout, Process Variations, and Cross Talk - researchr publication authors

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Ke Peng, Mahmut Yilmaz, Mohammad Tehranipoor. Circuit Path Grading Considering Layout, Process Variations, and Cross Talk. In Sandeep Kumar Goel, Krishnendu Chakrabarty, editors, Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits. pages 95-118, CRC Press, 2014.

This author has not been identified. Look up 'Ke Peng' in GoogleThis author has not been identified. Look up 'Mahmut Yilmaz' in GoogleThis author has not been identified. Look up 'Mohammad Tehranipoor' in Google

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