Simulation of the thermal stress induced by CW 1340 nm laser on 28 nm advanced technologies

Maxime Penzes, S. Dudit, F. Monsieur, Luca Silvestri, F. Nallet, D. Lewis, P. Perdu. Simulation of the thermal stress induced by CW 1340 nm laser on 28 nm advanced technologies. Microelectronics Reliability, 76:227-232, 2017. [doi]

Abstract

Abstract is missing.