F. Monsieur - researchr alias

researchr

You are not signed in
Sign in
Sign up

Viewing Publication 1 - 13 from 13

2017

Simulation of the thermal stress induced by CW 1340 nm laser on 28 nm advanced technologiesMaxime Penzes, S. Dudit, F. Monsieur, Luca Silvestri, F. Nallet, D. Lewis, P. Perdu. mr, 76:227-232, 2017. [doi]

2014

The importance of the spacer region to explain short channels mobility collapse in 28nm Bulk and FDSOI technologiesF. Monsieur, Y. Denis, D. Rideau, V. Quenette, G. Gouget, Clément Tavernier, Hervé Jaouen, Gérard Ghibaudo, J. Lacord. essderc 2014: 254-257 [doi]

2008

Impact of inside spacer process on fully self-aligned 250 GHz SiGe: C HBTs reliability performances: a-Si vs. nitrideM. Diop, N. Revil, M. Marin, F. Monsieur, P. Chevalier, G. Ghibaudo. mr, 48(8-9):1198-1201, 2008. [doi]

2007

Degradation mechanism understanding of NLDEMOS SOI in RF applicationsD. Lachenal, A. Bravaix, F. Monsieur, Yannick Rey-Tauriac. mr, 47(9-11):1634-1638, 2007. [doi]

2005

Multi-vibrational hydrogen release: Physical origin of T::bd::, Q::bd:: power-law voltage dependence of oxide breakdown in ultra-thin gate oxidesG. Ribes, S. Bruyère, M. Denais, F. Monsieur, V. Huard, D. Roy, G. Ghibaudo. mr, 45(12):1842-1854, 2005. [doi]

2003

On the role of holes in oxide breakdown mechanism in inverted nMOSFETsF. Monsieur, E. Vincent, V. Huard, S. Bruyère, D. Roy, Thomas Skotnicki, G. Pananakakis, G. Ghibaudo. mr, 43(8):1199-1202, 2003. [doi]

New insights into the change of voltage acceleration and temperature activation of oxide breakdownG. Ribes, S. Bruyère, F. Monsieur, D. Roy, V. Huard. mr, 43(8):1211-1214, 2003. [doi]

2002

Gate oxide Reliability assessment optimizationF. Monsieur, E. Vincent, D. Roy, S. Bruyère, G. Pananakakis, G. Ghibaudo. mr, 42(9-11):1505-1508, 2002. [doi]

Series resistance and oxide thickness spread influence on Weibull breakdown distribution: New experimental correction for reliability projection improvementD. Roy, S. Bruyère, E. Vincent, F. Monsieur. mr, 42(9-11):1497-1500, 2002. [doi]

2001

Sign in or sign up to see more results.

runs on WebDSL