VLSI functional analysis by dynamic emission microscopy

Philippe Perdu, Jerome Di-Battista, Sylvain Dudit, Tomonori Nakamura. VLSI functional analysis by dynamic emission microscopy. Microelectronics Reliability, 50(9-11):1431-1435, 2010. [doi]

Authors

Philippe Perdu

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Jerome Di-Battista

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Sylvain Dudit

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Tomonori Nakamura

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