Philippe Perdu, Jerome Di-Battista, Sylvain Dudit, Tomonori Nakamura. VLSI functional analysis by dynamic emission microscopy. Microelectronics Reliability, 50(9-11):1431-1435, 2010. [doi]
@article{PerduDDN10,
title = {VLSI functional analysis by dynamic emission microscopy},
author = {Philippe Perdu and Jerome Di-Battista and Sylvain Dudit and Tomonori Nakamura},
year = {2010},
doi = {10.1016/j.microrel.2010.07.077},
url = {http://dx.doi.org/10.1016/j.microrel.2010.07.077},
tags = {analysis},
researchr = {https://researchr.org/publication/PerduDDN10},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {50},
number = {9-11},
pages = {1431-1435},
}