Scan testing of micropipelines

O. A. Petlin, Stephen B. Furber. Scan testing of micropipelines. In 13th IEEE VLSI Test Symposium (VTS 95), April 30 - May 3, 1995, Princeton, New Jersey, USA. pages 296-303, IEEE Computer Society, 1995. [doi]

Authors

O. A. Petlin

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Stephen B. Furber

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