Konstantin Petrosyants, Eric Vologdin, Dmitry Smirnov, Rostislav Torgovnikov, Maxim Kozhukhov. Si BJT and SiGe HBT performance modeling after neutron radiation exposure. In Vladimir Hahanov, Yervant Zorian, editors, 9th East-West Design & Test Symposium, EWDTS 2011, Sevastopol, Ukraine, September 9-12, 2011. pages 267-270, IEEE, 2011. [doi]
Abstract is missing.