On measurement of parameters of programmable microelectronic nanostructures under accelerating extreme conditions (Xilinx 28nm XC7Z020 Zynq FPGA)

Petr Pfeifer, Zdenek PlĂ­va. On measurement of parameters of programmable microelectronic nanostructures under accelerating extreme conditions (Xilinx 28nm XC7Z020 Zynq FPGA). In 23rd International Conference on Field programmable Logic and Applications, FPL 2013, Porto, Portugal, September 2-4, 2013. pages 1-4, IEEE, 2013. [doi]

Abstract

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