An efficient on-line-test and back-up scheme for embedded processors

Matthias Pflanz, Heinrich Theodor Vierhaus, F. Pompsch. An efficient on-line-test and back-up scheme for embedded processors. In Proceedings IEEE International Test Conference 1999, Atlantic City, NJ, USA, 27-30 September 1999. pages 964-972, IEEE Computer Society, 1999.

@inproceedings{PflanzVP99,
  title = {An efficient on-line-test and back-up scheme for embedded processors},
  author = {Matthias Pflanz and Heinrich Theodor Vierhaus and F. Pompsch},
  year = {1999},
  tags = {testing},
  researchr = {https://researchr.org/publication/PflanzVP99},
  cites = {0},
  citedby = {0},
  pages = {964-972},
  booktitle = {Proceedings IEEE International Test Conference 1999, Atlantic City, NJ, USA, 27-30 September 1999},
  publisher = {IEEE Computer Society},
}