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An efficient on-line-test and back-up scheme for embedded processors

Matthias Pflanz, Heinrich Theodor Vierhaus, F. Pompsch. An efficient on-line-test and back-up scheme for embedded processors. In Proceedings IEEE International Test Conference 1999, Atlantic City, NJ, USA, 27-30 September 1999. pages 964-972, IEEE Computer Society, 1999.

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