On-line Error Detection Techniques for Dependable Embedded Processors with High Complexity

Matthias Pflanz, K. Walther, Heinrich Theodor Vierhaus. On-line Error Detection Techniques for Dependable Embedded Processors with High Complexity. In 7th IEEE International On-Line Testing Workshop (IOLTW 2001), 9-11 July 2001, Taormina, Italy. pages 51-53, IEEE Computer Society, 2001. [doi]

@inproceedings{PflanzWV01,
  title = {On-line Error Detection Techniques for Dependable Embedded Processors with High Complexity},
  author = {Matthias Pflanz and K. Walther and Heinrich Theodor Vierhaus},
  year = {2001},
  url = {http://csdl.computer.org/comp/proceedings/ioltw/2001/1290/00/12900051abs.htm},
  researchr = {https://researchr.org/publication/PflanzWV01},
  cites = {0},
  citedby = {0},
  pages = {51-53},
  booktitle = {7th IEEE International On-Line Testing Workshop (IOLTW 2001), 9-11 July 2001, Taormina, Italy},
  publisher = {IEEE Computer Society},
  isbn = {0-7695-1290-9},
}