Omkar Phadke, Khandker Akif Aabrar, Yuan-Chun Luo, Sharadindu Gopal Kirtania, Asif Islam Khan, Suman Datta, Shimeng Yu. Low-Frequency Noise Characteristics of Ferroelectric Field-Effect Transistors. In IEEE International Reliability Physics Symposium, IRPS 2023, Monterey, CA, USA, March 26-30, 2023. pages 1-4, IEEE, 2023. [doi]
Abstract is missing.