Fine-grained intercontact characterization in disruption-tolerant networks

Tiphaine Phe-Neau, Marcelo Dias de Amorim, Vania Conan. Fine-grained intercontact characterization in disruption-tolerant networks. In Proceedings of the 16th IEEE Symposium on Computers and Communications, ISCC 2011, Kerkyra, Corfu, Greece, June 28 - July 1, 2011. pages 271-276, IEEE, 2011. [doi]

Authors

Tiphaine Phe-Neau

This author has not been identified. Look up 'Tiphaine Phe-Neau' in Google

Marcelo Dias de Amorim

This author has not been identified. Look up 'Marcelo Dias de Amorim' in Google

Vania Conan

This author has not been identified. Look up 'Vania Conan' in Google