Tiphaine Phe-Neau, Marcelo Dias de Amorim, Vania Conan. Fine-grained intercontact characterization in disruption-tolerant networks. In Proceedings of the 16th IEEE Symposium on Computers and Communications, ISCC 2011, Kerkyra, Corfu, Greece, June 28 - July 1, 2011. pages 271-276, IEEE, 2011. [doi]
@inproceedings{Phe-NeauAC11,
title = {Fine-grained intercontact characterization in disruption-tolerant networks},
author = {Tiphaine Phe-Neau and Marcelo Dias de Amorim and Vania Conan},
year = {2011},
doi = {10.1109/ISCC.2011.5983789},
url = {http://dx.doi.org/10.1109/ISCC.2011.5983789},
researchr = {https://researchr.org/publication/Phe-NeauAC11},
cites = {0},
citedby = {0},
pages = {271-276},
booktitle = {Proceedings of the 16th IEEE Symposium on Computers and Communications, ISCC 2011, Kerkyra, Corfu, Greece, June 28 - July 1, 2011},
publisher = {IEEE},
}