Analog-testability analysis by determinant-decision-diagrams based symbolic analysis - researchr publication authors

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Tao Pi, C.-J. Richard Shi. Analog-testability analysis by determinant-decision-diagrams based symbolic analysis. In Proceedings of ASP-DAC 2000, Asia and South Pacific Design Automation Conference 2000, Yokohama, Japan. pages 541-546, ACM, 2000. [doi]

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