Tao Pi, C.-J. Richard Shi. Analog-testability analysis by determinant-decision-diagrams based symbolic analysis. In Proceedings of ASP-DAC 2000, Asia and South Pacific Design Automation Conference 2000, Yokohama, Japan. pages 541-546, ACM, 2000. [doi]
@inproceedings{PiS00,
title = {Analog-testability analysis by determinant-decision-diagrams based symbolic analysis},
author = {Tao Pi and C.-J. Richard Shi},
year = {2000},
doi = {10.1145/368434.368784},
url = {http://doi.acm.org/10.1145/368434.368784},
tags = {rule-based, testing, analysis, C++},
researchr = {https://researchr.org/publication/PiS00},
cites = {0},
citedby = {0},
pages = {541-546},
booktitle = {Proceedings of ASP-DAC 2000, Asia and South Pacific Design Automation Conference 2000, Yokohama, Japan},
publisher = {ACM},
isbn = {0-7803-5974-7},
}