Herold Pilo, R. Dean Adams, Robert E. Busch, Eric A. Nelson, Geoerge E. Rudgers. Bitline contacts in high density SRAMs: design for testability and stressability. In Proceedings IEEE International Test Conference 2001, Baltimore, MD, USA, 30 October - 1 November 2001. pages 776-782, IEEE Computer Society, 2001.
@inproceedings{PiloABNR01,
title = {Bitline contacts in high density SRAMs: design for testability and stressability},
author = {Herold Pilo and R. Dean Adams and Robert E. Busch and Eric A. Nelson and Geoerge E. Rudgers},
year = {2001},
tags = {design science, testing, e-science, design},
researchr = {https://researchr.org/publication/PiloABNR01},
cites = {0},
citedby = {0},
pages = {776-782},
booktitle = {Proceedings IEEE International Test Conference 2001, Baltimore, MD, USA, 30 October - 1 November 2001},
publisher = {IEEE Computer Society},
isbn = {0-7803-7169-0},
}