Kranthi K. Pinjala, Bruce C. Kim. An Approach for Selection of Test Points for Analog Fault Diagnosis. In 18th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2003), 3-5 November 2003, Boston, MA, USA, Proceedings. pages 287-294, IEEE Computer Society, 2003. [doi]
Abstract is missing.