Alessandra Pipino, Federica Resta, Luca Mangiagalli, Federico Fary, Marcello De Matteis, Hubert Kroha, R. Richter, Oliver Kortner, Andrea Baschirotto. sMDT Detectors Read-Out in 28nm technology. In 26th IEEE International Conference on Electronics, Circuits and Systems, ICECS 2019, Genoa, Italy, November 27-29, 2019. pages 691-694, IEEE, 2019. [doi]
@inproceedings{PipinoRMFMKRKB19,
title = {sMDT Detectors Read-Out in 28nm technology},
author = {Alessandra Pipino and Federica Resta and Luca Mangiagalli and Federico Fary and Marcello De Matteis and Hubert Kroha and R. Richter and Oliver Kortner and Andrea Baschirotto},
year = {2019},
doi = {10.1109/ICECS46596.2019.8964714},
url = {https://doi.org/10.1109/ICECS46596.2019.8964714},
researchr = {https://researchr.org/publication/PipinoRMFMKRKB19},
cites = {0},
citedby = {0},
pages = {691-694},
booktitle = {26th IEEE International Conference on Electronics, Circuits and Systems, ICECS 2019, Genoa, Italy, November 27-29, 2019},
publisher = {IEEE},
isbn = {978-1-7281-0996-1},
}