Alessandra Pipino, Federica Resta, Luca Mangiagalli, Federico Fary, Marcello De Matteis, Hubert Kroha, R. Richter, Oliver Kortner, Andrea Baschirotto. sMDT Detectors Read-Out in 28nm technology. In 26th IEEE International Conference on Electronics, Circuits and Systems, ICECS 2019, Genoa, Italy, November 27-29, 2019. pages 691-694, IEEE, 2019. [doi]
Abstract is missing.