Impact of crosstalk and process variation on capture power reduction for at-speed test - researchr publication authors

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Surya Piplani, G. S. Visweswaran, Anshul Kumar. Impact of crosstalk and process variation on capture power reduction for at-speed test. In 34th IEEE VLSI Test Symposium, VTS 2016, Las Vegas, NV, USA, April 25-27, 2016. pages 1-6, IEEE Computer Society, 2016. [doi]

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