Surya Piplani, G. S. Visweswaran, Anshul Kumar. Impact of crosstalk and process variation on capture power reduction for at-speed test. In 34th IEEE VLSI Test Symposium, VTS 2016, Las Vegas, NV, USA, April 25-27, 2016. pages 1-6, IEEE Computer Society, 2016. [doi]
@inproceedings{PiplaniVK16,
title = {Impact of crosstalk and process variation on capture power reduction for at-speed test},
author = {Surya Piplani and G. S. Visweswaran and Anshul Kumar},
year = {2016},
doi = {10.1109/VTS.2016.7477291},
url = {http://doi.ieeecomputersociety.org/10.1109/VTS.2016.7477291},
researchr = {https://researchr.org/publication/PiplaniVK16},
cites = {0},
citedby = {0},
pages = {1-6},
booktitle = {34th IEEE VLSI Test Symposium, VTS 2016, Las Vegas, NV, USA, April 25-27, 2016},
publisher = {IEEE Computer Society},
isbn = {978-1-4673-8454-4},
}