Low-frequency noise in bare SOI wafers: Experiments and model

Luca Pirro, Irina Ionica, Sorin Cristoloveanu, GĂ©rard Ghibaudo. Low-frequency noise in bare SOI wafers: Experiments and model. In 45th European Solid State Device Research Conference, ESSDERC 2015, Graz, Austria, September 14-18, 2015. pages 286-289, IEEE, 2015. [doi]

Abstract

Abstract is missing.