Luca Pirro, A. Jayakumar, Olaf Zimmerhackl, D. Lipp, R. Illgen, A. Muehlhoff, R. Pfuetzner, Alban Zaka, M. Otto, Jan Hoentschel, Y. Raffel, Konrad Seidel, Ricardo Olivo. Comparison of Analog and Noise Performance between Buried Channel versus Surface Devices in HKMG I/O Devices. In IEEE International Reliability Physics Symposium, IRPS 2021, Monterey, CA, USA, March 21-25, 2021. pages 1-4, IEEE, 2021. [doi]
Abstract is missing.