Luca Pirro, P. Liebscher, C. Brantz, M. Kessler, H. Herzog, Olaf Zimmerhackl, R. Jain, E. Ebrand, K. Gebauer, M. Otto, Alban Zaka, Jan Hoentschel. Impact of Electrical Defects located at Transistor Periphery on Analog and RTN Device Performance. In IEEE International Reliability Physics Symposium, IRPS 2022, Dallas, TX, USA, March 27-31, 2022. pages 59-1, IEEE, 2022. [doi]
@inproceedings{PirroLBKHZJEGOZ22,
title = {Impact of Electrical Defects located at Transistor Periphery on Analog and RTN Device Performance},
author = {Luca Pirro and P. Liebscher and C. Brantz and M. Kessler and H. Herzog and Olaf Zimmerhackl and R. Jain and E. Ebrand and K. Gebauer and M. Otto and Alban Zaka and Jan Hoentschel},
year = {2022},
doi = {10.1109/IRPS48227.2022.9764532},
url = {https://doi.org/10.1109/IRPS48227.2022.9764532},
researchr = {https://researchr.org/publication/PirroLBKHZJEGOZ22},
cites = {0},
citedby = {0},
pages = {59},
booktitle = {IEEE International Reliability Physics Symposium, IRPS 2022, Dallas, TX, USA, March 27-31, 2022},
publisher = {IEEE},
isbn = {978-1-6654-7950-9},
}