Luca Pirro, P. Liebscher, C. Brantz, M. Kessler, H. Herzog, Olaf Zimmerhackl, R. Jain, E. Ebrand, K. Gebauer, M. Otto, Alban Zaka, Jan Hoentschel. Impact of Electrical Defects located at Transistor Periphery on Analog and RTN Device Performance. In IEEE International Reliability Physics Symposium, IRPS 2022, Dallas, TX, USA, March 27-31, 2022. pages 59-1, IEEE, 2022. [doi]
Abstract is missing.