Luca Pirro, A. Zaka, O. Zimmerhackl, T. Hermann, M. Otto, E. M. Bazizi, Jan Hoentschel, X. Li, R. Taylor. Low-Frequency Noise Reduction in 22FDX®: Impact of Device Geometry and Back Bias. In IEEE International Reliability Physics Symposium, IRPS 2019, Monterey, CA, USA, March 31 - April 4, 2019. pages 1-5, IEEE, 2019. [doi]
Abstract is missing.