James F. Plusquellic, Donald M. Chiarulli, Steven P. Levitan. Digital Integrated Circuit Testing using Transient Signal Analysis. In Proceedings IEEE International Test Conference 1996, Test and Design Validity, Washington, DC, USA, October 20-25, 1996. pages 481-490, IEEE Computer Society, 1996.
No references recorded for this publication.
No citations of this publication recorded.