James F. Plusquellic - researchr alias

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Viewing Publication 1 - 18 from 18

2017

Physical unclonable functions and dynamic partial reconfiguration for security in resource-constrained embedded systemsG. Pocklassery, Venkata K. Kajuruli, James F. Plusquellic, Fareena Saqib. host 2017: 116-121 [doi]

2015

GDS-II Trojan detection using multiple supply pad VDD and GND IDDQs in ASIC functional unitsI. Wilcox, Fareena Saqib, James F. Plusquellic. host 2015: 144-150 [doi]

2014

ASIC implementation of a hardware-embedded physical unclonable functionFareena Saqib, Matthew Areno, Jim Aarestad, James F. Plusquellic. iet-cdt, 8(6):288-299, 2014. [doi]

2013

Secure mobile authentication and device association with enhanced cryptographic enginesMatthew Areno, James F. Plusquellic. prisms 2013: 1-8 [doi]

2010

A Sensitivity Analysis of Power Signal Methods for Detecting Hardware Trojans Under Real Process and Environmental ConditionsReza M. Rad, James F. Plusquellic, Mohammad Tehranipoor. tvlsi, 18(12):1735-1744, 2010. [doi]

2008

Hardware Trojan Detection and Isolation Using Current Integration and Localized Current AnalysisXiaoxiao Wang, Hassan Salmani, Mohammad Tehranipoor, James F. Plusquellic. dft 2008: 87-95 [doi]

2005

A Comparitive Study of W-cdma Cell Search DesignsSanat Kamal Bahl, James F. Plusquellic, Joseph Thomas. jcsc, 14(1):129-136, 2005. [doi]

2003

Power supply transient signal analysis for defect-oriented testJames F. Plusquellic, Abhishek Singh, Chintan Patel, Anne E. Gattiker. tcad, 22(3):370-374, 2003. [doi]

Comparison of Branching CORDIC ImplementationsAbhishek Singh, Dhananjay S. Phatak, Tom Goff, Mike Riggs, James F. Plusquellic, Chintan Patel. asap 2003: 215-225 [doi]

2001

Power supply transient signal integration circuitChintan Patel, Fidel Muradali, James F. Plusquellic. itc 2001: 704-712

Detecting delay faults using power supply transient signal analysisAbhishek Singh, Chintan Patel, Shirong Liao, James F. Plusquellic, Anne E. Gattiker. itc 2001: 395-404

2000

Detection of CMOS Defects under Variable Processing ConditionsAmy Germida, James F. Plusquellic. vts 2000: 195-204 [doi]

Predicting device performance from pass/fail transient signal analysis dataJames F. Plusquellic, Amy Germida, Jonathan Hudson, Ernesto Staroswiecki, Chintan Patel. itc 2000: 1070-1079

1999

Defect detection using power supply transient signal analysisAmy Germida, Zheng Yan, James F. Plusquellic, Fidel Muradali. itc 1999: 67-76

8-Bit Multiplier Simulation Experiments Investigating the Use of Power Supply Transient Signals for the Detection of CMOS DefectsJames F. Plusquellic, Amy Germida, Zheng Yan. dft 1999: 68-76 [doi]

1998

Characterization of CMOS Defects using Transient Signal AnalysisJames F. Plusquellic, Donald M. Chiarulli, Steven P. Levitan. dft 1998: 93-101 [doi]

1997

Identification of Defective CMOS Devices Using Correlation and Regression Analysis of Frequency Domain Transient Signal DataJames F. Plusquellic, Donald M. Chiarulli, Steven P. Levitan. itc 1997: 40-49

1996

Digital Integrated Circuit Testing using Transient Signal AnalysisJames F. Plusquellic, Donald M. Chiarulli, Steven P. Levitan. itc 1996: 481-490

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