Predicting device performance from pass/fail transient signal analysis data

James F. Plusquellic, Amy Germida, Jonathan Hudson, Ernesto Staroswiecki, Chintan Patel. Predicting device performance from pass/fail transient signal analysis data. In Proceedings IEEE International Test Conference 2000, Atlantic City, NJ, USA, October 2000. pages 1070-1079, IEEE Computer Society, 2000.

Abstract

Abstract is missing.