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Predicting device performance from pass/fail transient signal analysis data

James F. Plusquellic, Amy Germida, Jonathan Hudson, Ernesto Staroswiecki, Chintan Patel. Predicting device performance from pass/fail transient signal analysis data. In Proceedings IEEE International Test Conference 2000, Atlantic City, NJ, USA, October 2000. pages 1070-1079, IEEE Computer Society, 2000.

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James F. Plusquellic

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Amy Germida

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Jonathan Hudson

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Ernesto Staroswiecki

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Chintan Patel

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