Anne E. Gattiker - researchr alias

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Viewing Publication 1 - 30 from 30

2019

Accelerating Conversational Agents Built With Off-the-Shelf Modularized ServicesJinho Lee, Inseok Hwang, Thomas Hubregtsen, Anne E. Gattiker, Christopher M. Durham. pervasive, 18(2):47-57, 2019. [doi]

2017

SCI-FII: Speculative Conversational Interface Framework for Incremental Inference on Modularized ServicesJinho Lee, Inseok Hwang, Thomas Hubregtsen, Anne E. Gattiker, Christopher M. Durham. MDM 2017: 278-285 [doi]

2013

Big Data text-oriented benchmark creation for HadoopAnne E. Gattiker, Fadi H. Gebara, H. Peter Hofstee, J. D. Hayes, A. Hylick. ibmrd, 57(3/4):10, 2013. [doi]

Hardware Acceleration of an Efficient and Accurate Proton Therapy Monte CarloThomas H. Osiecki, Min-yu Tsai, Anne E. Gattiker, Damir A. Jamsek, Sani R. Nassif, William Evan Speight, Cliff C. N. Sze. iccs 2013: 2241-2250 [doi]

2012

Guest Editors' Introduction: Yield Learning Processes and MethodsAnne E. Gattiker, Phil Nigh. dt, 29(1):6-7, 2012. [doi]

2011

2006

2004

Diagnosis Meets Physical Failure Analysis: How Long can we Succeed?Anne E. Gattiker. itc 2003: 1441 [doi]

Random and Systematic Defect Analysis Using IDDQ Signature Analysis for Understanding Fails and Guiding Test DecisionsPhil Nigh, Anne E. Gattiker. itc 2003: 309-318 [doi]

2003

Deformations of IC Structure in Test and Yield LearningWojciech Maly, Anne E. Gattiker, Thomas Zanon, Thomas J. Vogels, R. D. (Shawn) Blanton, Thomas M. Storey. itc 2003: 856-865 [doi]

Power supply transient signal analysis for defect-oriented testJames F. Plusquellic, Abhishek Singh, Chintan Patel, Anne E. Gattiker. tcad, 22(3):370-374, 2003. [doi]

2002

2001

Timing Yield Estimation from Static Timing AnalysisAnne E. Gattiker, Sani R. Nassif, Rashmi Dinakar, Chris Long. isqed 2001: 437-442 [doi]

Detecting delay faults using power supply transient signal analysisAbhishek Singh, Chintan Patel, Shirong Liao, James F. Plusquellic, Anne E. Gattiker. itc 2001: 395-404

2000

Test method evaluation experiments and dataPhil Nigh, Anne E. Gattiker. itc 2000: 454-463

1998

Toward understanding Iddq-only failsAnne E. Gattiker, Wojciech Maly. itc 1998: 174-183 [doi]

1997

Smart Substrate MCMsAnne E. Gattiker, Wojciech Maly. et, 10(1-2):39-53, 1997. [doi]

Current signatures: application [to CMOS]Anne E. Gattiker, Wojciech Maly. itc 1997: 1168-1177 [doi]

Current Signatures: ApplicationAnne E. Gattiker, Wojciech Maly. itc 1997: 156-165

To DFT or Not to DFT?Sichao Wei, Pranab K. Nag, Ronald D. Blanton, Anne E. Gattiker, Wojciech Maly. itc 1997: 557-566

1996

Current signatures [VLSI circuit testing]Anne E. Gattiker, Wojciech Maly. vts 1996: 112-117 [doi]

1994

Feasibility Study of Smart Substrate Multichip ModulesAnne E. Gattiker, Wojciech Maly. itc 1994: 41-49

Smart-Substrate Multichip-Module SystemsWojciech Maly, Derek Feltham, Anne E. Gattiker, Mark D. Hobaugh, Kenneth Backus, Michael E. Thomas. dt, 11(2):64-73, 1994. [doi]

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Publications by 'Anne E. Gattiker'

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2019

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1994

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