Anne E. Gattiker, Phil Nigh. Using well/substrate bias manipulation to enhance voltage-test-based defect detection. In Bill Eklow, R. D. (Shawn) Blanton, editors, 2011 IEEE International Test Conference, ITC 2011, Anaheim, CA, USA, September 20-22, 2011. pages 1-6, IEEE, 2011. [doi]
Abstract is missing.