Duane S. Boning, Joseph Panganiban, Karen Gonzalez-Valentin, Sani R. Nassif, Chandler McDowell, Anne E. Gattiker, Frank Liu. Test structures for delay variability. In David P. LaPotin, Charles J. Alpert, John Lillis, editors, Proceedings of the 8th ACM/IEEE International Workshop on Timing Issues in the Specification and Synthesis of Digital Systems, Monterey, California, USA, December 2-3, 2002. pages 109, ACM, 2002. [doi]
Abstract is missing.