Duane S. Boning, Joseph Panganiban, Karen Gonzalez-Valentin, Sani R. Nassif, Chandler McDowell, Anne E. Gattiker, Frank Liu. Test structures for delay variability. In David P. LaPotin, Charles J. Alpert, John Lillis, editors, Proceedings of the 8th ACM/IEEE International Workshop on Timing Issues in the Specification and Synthesis of Digital Systems, Monterey, California, USA, December 2-3, 2002. pages 109, ACM, 2002. [doi]
@inproceedings{BoningPGNMGL02,
title = {Test structures for delay variability},
author = {Duane S. Boning and Joseph Panganiban and Karen Gonzalez-Valentin and Sani R. Nassif and Chandler McDowell and Anne E. Gattiker and Frank Liu},
year = {2002},
doi = {10.1145/589411.589435},
url = {http://doi.acm.org/10.1145/589411.589435},
tags = {testing},
researchr = {https://researchr.org/publication/BoningPGNMGL02},
cites = {0},
citedby = {0},
pages = {109},
booktitle = {Proceedings of the 8th ACM/IEEE International Workshop on Timing Issues in the Specification and Synthesis of Digital Systems, Monterey, California, USA, December 2-3, 2002},
editor = {David P. LaPotin and Charles J. Alpert and John Lillis},
publisher = {ACM},
isbn = {1-58113-526-2},
}