Kerry Bernstein, David J. Frank, Anne E. Gattiker, Wilfried Haensch, Brian L. Ji, Sani R. Nassif, Edward J. Nowak, Dale J. Pearson, Norman J. Rohrer. High-performance CMOS variability in the 65-nm regime and beyond. IBM Journal of Research and Development, 50(4-5):433-450, 2006. [doi]
Abstract is missing.